Special Session: “6 Years of Graduate School Intelligent Methods for Test and Reliability”

Test methods that can keep up with the ongoing increase in complexity of semiconductor products and their underlying technologies are an essential prerequisite for maintaining quality and safety of our daily lives and for continued success of our economies and societies. The Graduate School on “Intelligent Methods for Semiconductor Test and Reliability” (GS-IMTR) at the University of Stuttgart is a large-scale, radically interdisciplinary effort to address the scientific-technological challenges in this domain. Funded by Advantest, one of the world leaders in automatic test equipment, GS-IMTR has supported two intakes of ten PhD candidates in projects selected through competitive peer review; one Assistant Professor; and the required infrastructure.

Towards the end of GS-IMTR’s six-year long run time, this special session will focus on the overall philosophy of this unprecedented industry-university collaboration, the results obtained, and the lesson learned. It will cover the Graduate School as a whole and will provide its exemplary highlights for four (out of 20) of its projects, representing GS-IMTR’s topical diversity.

Talks

1. (10 min.) Ilia Polian, University of Stuttgart, member of GS-IMTR Board of Directors
   “Introduction into Graduate School Intelligent Methods Test and Reliability”
2. (30 min.) Kotaro Hasegawa, Senior Vice President Advantest Japan
   “Beyond Today: Shaping the Future of the Semiconductor Industry”
   Short talks by PhD students from exemplary projects (all University of Stuttgart):
3. (12 min.) Tim Strobel, “Intelligent Sensing and On-Chip Learning for Silicon Lifecycle Management.”
4. (12 min.) Yang Yang, “Automated Extraction of Interpretable Variable Expressions for Semiconductor Test Data Analysis”
5. (12 min.) Anand Venkatachalam, “Analytics Driven Intelligent Device Tester Calibration”
6. (12 min.) Thorben Schey, “Adaptive Real-Time Decision Making in Mixed-Signal Testing”