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Overview

With the test technology facing its grand challenges to ensure the quality of ICs and electronic systems incorporating more and more sophisticated manufacturing processes and system integration technologies in various emerging applications such as Internet of Things, cloud computing, automotive electronics, etc., global proliferation and cooperation is increasingly more important. International Test Conference has been a flagship conference in test technology since 1970. With an attempt to stimulate more discussion and interaction between the academia and the industry around the globe, the 1st ITC-Asia was initiated in Taipei in 2017, and the 2nd ITC-Asia was held with great success in Harbin China in 2018. The 3rd ITC-Asia will be held in Tokyo Japan in 2019. Attendee can involve themselves in attractive sessions on the state-of-the-art test technology trend and several industry topics. We kindly invite you to submit your work to ITC-Asia 2019. The outstanding papers with extension will be invited to ITC-2019.

Call for Papers                        Click Here to Submit

News

Dr. Cheng-Wen Wu, Professor with National Tsing Hua University, will give a keynote in ITC-Asia 2019.

The 14th VDEC D2T Symposium will be held in conjunction with ITC-Asia 2019.

Key Days

  • Submission of title and abstract: Jan. 25, 2019.   Extended to Feb.8,  Extended to Feb.22
  • Paper submission deadline: Feb. 8, 2019. Extended to March 8
  • Notification of acceptance: April 19, 2019. Extended to May 17
  • Camera-ready manuscript: May 31, 2019. Extended to June 7