Sept. 4 Wednesday (10:50 am – 11:40 am)@Niwa Hall
Topic: IC Test – Where the Excitement Never Ceases to End
Speaker: Dr. Rohit Kapu (Cadence Design Systems, Inc.)
IC test has been a rapidly evolving area. The evolution of test methods over the years is presented with the focus on the issues of today. The presentation will cover a few interesting technologies from the past with the goal of discussing the key aspects of good solutions. Characteristics of technologies that are successful in the industry will be covered with a key focus on layout aware solutions.
About the Speaker:
Dr. Rohit Kapu is a Distinguished Engineer at Cadence in the area of Test Automation. Rohit is an IEEE Fellow and has a Ph.D. from the University of Texas at Austin specializing in IC Testing.Rohit has chaired the IEEE 1450.6 standard that defines the Core Test Language which is currently being used in the major EDA solutions.
Dr. Rohit has served on the board of governors of Computer Society, he has chaired the standards activities for IEEE in the test area for over 10 years and currently serves on the board of IEEE Computer Magazine leading the publications in Computing Practices. Rohit is the author of a book and has over 100 publications and 40 patents in the area of IC test.
Sept. 5 Thursday (10:40 am – 11:40 am) @Niwa Hall
Topic: Semiconductor Device and Test in Data Explosion Period
Speaker: Shin Kimura (ADVANTEST CORPORATION)
The rapid pace of change in society, formerly called Dog year, can be said to be accelerating without abating. Next-generation communication system 5G that supports exploding data infrastructure expansion. The future of the car industry that is a huge industry, CASE (Connected, Autonomous, Shared/Service, Electric). An information society that evolves itself without human intervention by the generalization of AI and IoT. The power industry is shifting to green energy. In all of these fields, semiconductors play a major role and continue to change. The function and quality assurance of the ever-changing semiconductor is the role of test engineering. This article describes trends in semiconductors that are microfabrication of a device, higher in functionality, higher in concentration, and higher power resistance, and the requirements and responses to testing.
About the Speaker:
Shin Kimura is a Fellow of Advantest Corporate Relation Group, Corporate Planning Division. Graduated from the Department of Computer Science, Utsunomiya University in 1985. Joined Takeda Riken (now Advantest) in the same year. Advantest America, Inc. in 1987-1994. Vice President of SE Business Group in 2011. Vice President of ASD System Development Business Group in 2013. Corporate Planning Division in 2018.
Sept. 5 Thursday (2:50 pm – 3:50 pm) @Niwa Hall
Topic: Implementation of Security Function utilizing Safety Verification Function for Collaboration of Security and Safety
Speaker: Nobuyasu Kanekawa (Hitachi, Ltd.)
This presentation discusses what is artificial intelligence(AI), and why safety is the major issue for the artificial intelligence for critical applications. The AI such as deep learning provides the optimal solution beyond the human intelligence, but the safety is not necessarily guaranteed. Therefore it is expected that the safe optimal solution beyond the human intelligence can be provided if the safety verification guarantees the operation of the AI. Furthermore, this presentation introduces approaches proposed by the author’s research group; – an approach to apply AI for control application safely adding safety verification to the AI, and an approach to utilize safety verification function to security.
About the Speaker:
Nobuyasu Kanekawa received BEng, MEng and PhD in Engineering from Tokyo Institute of Technology in 1985, 1987 and 1998, respectively. He joined Hitachi Research Laboratory, Hitachi Ltd. in 1987, and currently he is Chief Researcher, Center for Technology Innovation – Controls.
Dr. Kanekawa was a visiting scholar at Computer Science Dept., University of California, Los Angeles in 1991-1992. He is IEICE fellow, ex-President of Reliability Engineering Association Japan, member of IFIP TC.10 and WG.10.4, International Expert of functional safety standards committees of IEC. His major publication is Dependability in Electronic Systems, Springer (2010)