The registration desk will be located in front of the International Conference Hall on the 3rd floor of Kunibiki Messe. It will be open during the following hours:

Sept. 12, Tue. 8:30 am – 6:00 pm
Sept. 13, Wed. 8:10 am – 4:00 pm
Sept. 14, Thu. 8:30 am – 4:00 pm

Please print your name tag (emailed to you) before you come to the registration desk.

Industry Exhibition will be flexibly opened during Sept. 13, Wed., 8:00 am – Sept. 14, Thu., 3:00 pm.

Sept. 12 (Tuesday)

9:00 am – 12:00 pm	Tutorial 1 @Int’l Conf. Hall Title: Scalable hierarchical DFT technologies for AI, SOC and multi-die Lecturers: Lee Harrison and Wu Yang (Siemens EDA)
1:00 pm – 4:00 pm	Tutorial 2 @Int’l Conf. Hall Title: Silicon Lifecycle Management: Trends, Challenges and Solutions Lecturer: Yervant Zorian (Synopsys, Inc.)

Sept. 13 (Wednesday)

8:40 am – 9:00 am		Opening @Int’l Conf. Hall
9:00 am – 9:50 am		Keynote 1 @Int’l Conf. Hall Title: Semiconductor Packaging Revolution in the Era of Chiplets Speaker: Yasumitsu Orii (Rapidus Corporation)
		Break @Small Hall
10:00 am – 10:50 am		Invited Talk 1 @Int’l Conf. Hall Title: Moore Meets Murphy Speaker: Erik Jan Marinissen (imec)
		Lunch @Small Hall
1:00 pm – 2:15 pm	Regular 1A @Int’l Conf. Hall “Hardware Security”	Special 1B @Room 501 “3D Chiplet Test Session 1”	Special 1C @Room 601 “Siemens Session (Silicon Lifecycle Management)”
		Break @Small Hall
2:45 pm – 4:00 pm	Regular 2A @Int’l Conf. Hall “Defect Analysis”	Special 2B @Room 501 “3D Chiplet Test Session 2”	Special 2C @Room 601 “Industry Session 1”
5:30 pm – 9:00 pm		Banquet @Yuushien Garden

Sept. 14 (Thursday)

9:00 am – 9:50 am		Keynote 2 @Int’l Conf. Hall Title: Technology for The Future of Computing Speaker: Shintaro Yamamichi (IBM Japan, Ltd.)
		Break
10:00 am – 10:50 am		Invited Talk 2 @Int’l Conf. Hall Title: Test Industry Challenges and Solutions as Observed by the Leading Physical Implementation Solution Provider Speaker: Janet Olson (Cadence Design Systems, Inc.)
		Lunch / Poster Presentations by High School Students @Small Hall
1:00 pm – 2:15 pm	Regular 3A @Int’l Conf. Hall “Processor/Software Testing”	Regular 3B @Room 501 “Fault Tolerant Latch”	Special 3C @Room 601 “Industry Session 2”
		Break
2:45 pm – 4:00 pm	Regular 4A @Int’l Conf. Hall “Testing and Verification”	Regular 4B @Room 501 “Memory”	Regular 4C @Room 601 “Jitter and Error Mitigation”